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Semi-Auto prober

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  Semi-automated Probe Systems AP-200 AP-300

  Temperature characteristic evaluation from -60°C to +350°C
  Probe solution for high-power devices. 20kV DC/200A

  ◎It is a semi-automated probe systems which supports wafer sizes of 6 inch and 8 inch respectively.

  ◎It has a compact shield to prevent dew condensation.

  ◎The compact shield provides a low noise environment.

  ◎Probe station equipped with APOLLOWAVE proprietary software realizes high test efficiency.

  ◎By image recognition, automatic wafer alignment and automatic chip alignment are possible.

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